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ISO, IEC, NIST and OECD International workshop on documentary standards for measurement and characterization of nanotechnologies


By csep - Posted on 08 June 2010

TitleISO, IEC, NIST and OECD International workshop on documentary standards for measurement and characterization of nanotechnologies
Publication TypeConference Proceedings
Year of Publication2008
Corporate AuthorsInternational Organization for Standardization, Organization for Economic Cooporation and Development, International Electrotechnical Commission, and National Institute of Standards and Technology
Conference NameInternational Workshop on Documentary Standards for Measurement of Nanotechnology (26-28 February 2008: Gaithersburg, MD)
Pagination40 p.
Date Published02/2008
PublisherInternational Organization for Standardization
Place PublishedGaithersburg, MD.
Publication LanguageEnglish
Abstract

The report, from the "International Workshop on Documentary Standards for Measurement and Characterization" in February of 2008 discusses the development, efficacy, harmonization, and uptake of documentary standards broadly relevant to the field of measurement and characterization of nanotechnologies. Some of the main conclusions of the conference include: (1) the need for greater coordination and communication between standard setting organizations, the wider public, and building mechanisms for the quick delivery of standards to stakeholders, (2) the development of best practices/guidance documents for the handling and testing of nanomaterials, and (3) the need for standards in handling and testing protocols in the area of human health and toxicology.

URLhttp://www.standardsinfo.net/info/livelink/fetch/2000/148478/7746082/assets/final_report.pdf