<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Woskie, Susan R.</style></author><author><style face="normal" font="default" size="100%">Bell, Dhimiter</style></author><author><style face="normal" font="default" size="100%">Virji, M. Abbas</style></author><author><style face="normal" font="default" size="100%">Stefaniak, Aleksandr B.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Understanding workplace processes and factors that determine exposures to engineered nanomaterials</style></title><secondary-title><style face="normal" font="default" size="100%">International Journal of Occupational and Environmental Health </style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2010</style></year></dates><volume><style face="normal" font="default" size="100%">16</style></volume><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">This article looks at the factors that
influence engineered nanomaterial exposures
in the workplace, and proposes a multi-tiered model in which information on exposure factors can be obtained at the macrolevel (examining differences in exposures between different ENM sectors or product types); the midlevel (examining differences in exposures between workplaces within the same ENM sector or product type); and the microlevel (examining differences in exposure between tasks or between ENM types during the same task). Further, within the microlevel, potential exposure factors are defined by a source-receptor model. The authors recommend that auxiliary data be collected systematically, along with exposure measurements, to enable analysis of exposure factors as well as the pooling of data across studies.</style></abstract><issue><style face="normal" font="default" size="100%">4</style></issue></record></records></xml>