<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>13</ref-type><contributors><translated-authors><author><style face="normal" font="default" size="100%">Institute for Electrical and Electronics Engineers Standards Association</style></author></translated-authors></contributors><titles><title><style face="normal" font="default" size="100%">IEEE P1650-2005 -- Test Methods for Measurement of Electrical Properties of Carbon Nanotubes</style></title></titles><dates><year><style  face="normal" font="default" size="100%">2005</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://grouper.ieee.org/groups/1650/</style></url></web-urls></urls><publisher><style face="normal" font="default" size="100%">Institute for Electrical and Electronics Engineers Standards Association </style></publisher><language><style face="normal" font="default" size="100%">English </style></language><abstract><style face="normal" font="default" size="100%">This standard recommends methods and standardized reporting practices for electrical characterization of carbon nanotubes. The standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for carbon nanotubes, and recommends practices in order to minimize the effect of measurement artifacts and other sources of error encountered when measuring carbon nanotubes.</style></abstract></record></records></xml>